Detect a sample of laser marking. Use CR-100V White Light Interferometer for detection. The three-dimensional morphology of the detected marks is more realistic.

Measured Sample

Surface Interference Fringes

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      The CR-100V white light interferometer features high-precision detection of three-dimensional profile information on the surface of the measured sample. It uses the principle of optical interference for non-contact detection. It is suitable for inspecting products with complex surface topography.

      The studio has long been dedicated to the research of optical interference detection technology. Optical interference detection features high precision and non-contact operation, with broad application prospects in high-end manufacturing.

        The CR-100V is the first fully integrated opto-mechatronic-computational instrument to be launched by our studio. There is also the CR-100, a white light interferometer combining optics and mechanics, which allows sample inspection through manual image analysis and is suitable for general surface topography measurement. Both instruments use our self-developed interferometric lenses, and their imaging quality and interference stability are comparable to similar foreign products. Patent applications are currently in progress.

        The CR-100 and CR-100V white light interferometers will release complete prototype systems around April 2018. Interested parties can follow our official WeChat public account.