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Micro-nano profiler measures lapped/polished surface roughness

      Using the Micro-Nano Profile Measurement System to measure the surface roughness of several ground and polished sample blocks.

      Normally, a roughness tester can be used for measurement, but under special requirements, only non-contact methods are feasible. The Micro-Nano Profile Measurement System can measure the surface roughness of ground and polished samples. The nominal Ra values of the tested sample blocks are 0.2um, 0.1um, and 0.05um.  

      1. Measurement of Ra0.2um sample block: 

640

Interference fringe pattern

640 (1)

Software measurement interface

6403

Measurement report

      Measurement result: For the ground and polished sample block with nominal Ra 0.2um, the measured roughness is Ra = 0.1933um.

      2. Measurement of Ra0.1um sample block: 

6404

Interference fringes

6405

Software interface

6406

Measurement report

      Measurement result: For the ground and polished sample block with nominal Ra 0.1um, the measured roughness is Ra = 0.1074um.

      3. Measurement of Ra0.05um sample block: 

6407

Interference fringes

6408

Software interface

6409

Measurement report

      Measurement result: For the ground and polished sample block with nominal Ra 0.05um, the measured roughness is Ra = 0.05027um.


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